Non-Destructive Measurement

The ContourPro 4D system eliminates the need to coat the sample in advance that otherwise not possible to measure.

Our proprietary non-destructive measurement methods (NDM) preserve your valuable test samples. This capability permits live measurement as well as continuous processing common to production environments. Further advantages now include execution of SPC testing or if needed, 100% sample testing. You realize this capability without going off-line and most importantly, not destroying your product to evaluate and collect critical information. The net result yields recovery of lost time, cost, and scarce resources; simply stated, your bottom line.

Optoniks’ ContourPro 4D system is capable of measuring your samples in an NDM fashion where other metrology systems fail. Exclusive ContourPro 4D Capabilities not available in other existing systems include the elimination of:

• ▪ Sample Destruction (time, resources & cost)
• ▪ Sample Coating (secondary processing & cost, lack of homogeneity)
• ▪ Mechanical Contact Methods (use of styli & associated cost to produce)
• ▪ Additive Uncertainty (coatings, cross sections, mechanical limitations)
• ▪ Additional Secondary Processing (time, cost, and effort)

The net result is high-density point cloud (3D) measurement data of key surfaces and feature information representing your sample of interest yielding the reduction of:

• ▪ Cost
• ▪ Time
• ▪ Technical Resources