Non-Destructive Measurement
Non-Contact and No-Coating are two aspects of Optoniks’ 3D profilometry system that makes it a Non-Destructive Measurement (NDM) metrology tool.
3D Shadow Removal™
Optoniks has developed a technique based on multiple camera angles to effectively remove errors in profile measurement due to obstruction of light at particular locations.
HDR Metrology™
Optoniks has developed the 3D HDR Metrology™ technology to overcome the issue of high-contrast ratio objects and surfaces in dimensional metrology.
Market Challenge
As electronic components become smaller and denser, detection of defects and fine-scale features are ever more critical in
achieving competitive advantage and performance.
Traditional measurement devices cannot keep up with the complex surfaces and
materials used in today’s product designs.
The trend in miniaturization across industries results in thinner layers that
need tighter controls and higher accuracy measurements. Effective quality control demands advanced precision metrology capabilities.
Optoniks' research team, patent position and field product strategy coupled with an experienced management team is well positioned
to lead the increasingly consequential field of precision metrology.
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Precise Measurement of Complex Surfaces with No-Coating
Highly experienced team in designing Optical Metrology systems
Significant Advancement in Optics through Leading-Edge Patents
